Observation of prior light emission before arcing development in a low-temperature plasma with multiple snapshot analysis
2022
Author
Si-jun Kim (Applied Physics Lab for PLasma Engineering (APPLE), Department of Physics, Chungnam National University), Young-seok Lee (Applied Physics Lab for PLasma Engineering (APPLE), Department of Physics, Chungnam National University), Chul-hee Cho (Applied Physics Lab for PLasma Engineering (APPLE), Department of Physics, Chungnam National University), Min-su Choi (Applied Physics Lab for PLasma Engineering (APPLE), Department of Physics, Chungnam National University), In-ho Seong (Applied Physics Lab for PLasma Engineering (APPLE), Department of Physics, Chungnam National University), Jang-jae Lee (Samsung Electronics), Dae-woong Kim (Department of Plasma Engineering, Korea Institute of Machinery and Materials (KIMM)), Shin-jae You (Applied Physics Lab for PLasma Engineering (APPLE), Department of Physics, Chungnam National University)
Abstract
Abstract Arcing is a ubiquitous phenomenon and a crucial issue in high-voltage applied systems, especially low-temperature plasma (LTP) engineering. Although arcing in LTPs has attracted interest due to the severe damage it can cause, its underlying mechanism has yet to be fully understood. To elucidate the arcing mechanism, this study investigated various signals conventionally used to analyze arcing such as light emission, arcing current and voltage, and background plasma potential. As a result, we found that light emission occurs as early as 0.56 μs before arcing current initiation, which is a significant indicator of the explosive development of arcing as well as other signals. We introduce an arcing inducing probe (AIP) designed to localize arcing on the tip edge along with multiple snapshot analysis since arcing occurs randomly in space and time. Analysis reveals that the prior light emission consists of sheath and tip glows from the whole AIP sheath and the AIP tip edge, respectively. Formation mechanisms of these emissions based on multiple snapshot image analysis are discussed. This light emission before arcing current initiation provides a significant clue to understanding the arcing formation mechanism and represents a new indicator for forecasting arcing in LTPs.
DOI
Journal
Scientific Reports
Source
DOAJ